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Direkt ³Ô¹ÏÍø Inhalt

A.V. Andreev, D. Rafaja, J. Kamarad, Z. Arnold, Y. Homma, Y. Shiokawa:
Magnetic properties of (Lu1−xYx)2Fe17 single crystals,
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A.V. Andreev, D. Rafaja, J. Kamarad, Z. Arnold, Y. Homma, Y. Shiokawa:
Magnetic properties of the Lu2Fe17−xSix single crystals,
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P. Klimanek, V. Klemm, M. Motylenko, A.E. Romanov:
Substructure Analysis in Heavily Deformed Materialsby Diffraction Methods,
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D.V. Kudashov, H. Baum, U. Martin, M. Heilmaier, H. Oettel:
Microstructure and room temperature hardening of ultra-fine-grained oxide-dispersion strengthened copper prepared by cryomilling,
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D.V. Kudashov, Bocharova E., U. Martin, H. Baum, G. Heinzel:
A study of processes concerned with formation of dispersion-strengthened copper during mechanical alloying by high-resolution scanning electron microscopy,
Izvestiya Vysshikh Uchebnykh Zavedenij. Tsvetnaya Metallurgiya (2004) 52-57.

D.V. Kudashov, U. Martin, M. Heilmaier, H. Oettel:
Creep behaviour of ultrafine-grained oxide dispersion strengthened copper prepared by cryomilling,
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U. Martin, M. Heilmaier:
Novel Dispersion Strengthened Metals by Mechanical Alloying,
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M. Motylenko, V. Klemm, P. Klimanek, T. Pavlovitch, H. Straube:
Characterization of the cell block structure and disclination configurations in plastically deformed metals by electron diffraction,

M. Onyuna, H. Oettel, U. Martin, A. Weiß:
On the Deformation Behaviour and Martensitic Transformations of Metastable Austenitic Steels,
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D. Rafaja:
Functional cubic thin films - A structure view,
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D. Rafaja, J. Ebert, G. Miehe, N. Martz, M. Knapp, B. Stahl, M. Ghafari, H. Hahn, H. Fuess, P. Schmollngruber, P. Farber, H. Siegle:
Changes in the real structure and magnetoresistance of Co90Fe10/Cu and Co90Fe10/Cu85Ag10Au5 multilayers after annealing,
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D. Rafaja, V. Klemm, G. Schreiber, M. Knapp, R. Kužel:
Interference phenomena observed by X-ray diffraction in nanocrystalline thin films,
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D. Rafaja, M. Šíma, V. Klemm, G. Schreiber, D. Heger, L. Havela, R. Kužel:
X-ray diffraction on nanocrystalline Ti1−xAlxN thin films,
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D. Rafaja:
X-Ray Scattering from Thin Films and Multilayers,
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